Machine Learning Design Patterns Solutions to Common Challenges in Data Preparation, Model Building, and MLOps-Fast Shipping
Sale!

Machine Learning Design Patterns Solutions to Common Challenges in Data Preparation, Model Building, and MLOps-Fast Shipping

Original price was: $79.99.Current price is: $23.99.

SKU: 215745 Category:

Description

The design patterns in this book capture best practices and solutions to recurring problems in machine learning. The authors, three Google engineers, catalog proven methods to help data scientists tackle common problems throughout the ML process. These design patterns codify the experience of hundreds of experts into straightforward, approachable advice.

In this book, you will find detailed explanations of 30 patterns for data and problem representation, operationalization, repeatability, reproducibility, flexibility, explainability, and fairness. Each pattern includes a description of the problem, a variety of potential solutions, and recommendations for choosing the best technique for your situation.

Youll learn how to:

Identify and mitigate common challenges when training, evaluating, and deploying ML models

Represent data for different ML model types, including embeddings, feature crosses, and more

Choose the right model type for specific problems

Build a robust training loop that uses checkpoints, distribution strategy, and hyperparameter tuning

Deploy scalable ML systems that you can retrain and update to reflect new data

Interpret model predictions for stakeholders and ensure models are treating users fairly

Author: Valliappa Lakshmanan, Sara Robinson, Michael Munn
Binding Type: Paperback
Publisher: OReilly Media
Published: 11/24/2020
Pages: 405
Weight: 1.45lbs
Size: 6.85h x 9.06w x 0.94d
ISBN: 9781098115784
Language: English

Reviews

There are no reviews yet.

Be the first to review “Machine Learning Design Patterns Solutions to Common Challenges in Data Preparation, Model Building, and MLOps-Fast Shipping”

Your email address will not be published. Required fields are marked *